X-Ray Analysis in the SEM: Part 4 "X Ray Detectors"

Ron Rasch from the Centre for Microscopy & Microanalysis at the University of Queensland, provides an introduction to analysing the elemental composition of samples. Topics include: X-ray production, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), spectral artefacts and an introduction to matrix correction effects (ZAF). This video is the final video of the series of 4 videos.

[@kavitarajpurohit6909]

This information was very helpful to me..
Thanks for giving such amazing explanation 🙏👍

[@MicroscopyAustralia]

Glad to hear that :)

[@MarsW1321]

The information here is a little out dated. The ice issue is only exists in LN2 detectors which can be barely seen on SEMs nowadays. Modern EDS has great improvement in terms of efficiency and low-kV X-ray detection. The data in the example is from 1998. The spectrum processing at that period is not a good as modern EDS software, especially on peak overlapping issue and background subtraction. It's good to see the comparison with WDS. Lots of people over relied on EDS thus ignored WDS. Thank you for the presentation.