Introduction to Focused Ion Beam (FIB)

The Materials Characterization Lab: Introduction to Focused Ion Beam (FIB)
The focused ion beam (FIB) is an extension to a scanning electron microscope (SEM). With FIB, we image and modify a specimen which includes site-specific material removal, deposition, and manipulation.
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[@hannahdimbert9637]

Thanks! I'm a grad student and this was a helpful introduction for my characterization class :)

[@wladenoo]

Thank you for the explanation! now its finally clear to me how its done.