Alignment of the JEOL F200 TEM for High resolution Imaging

In this video the JEOL F200 Transmission Electron Microscope is aligned in TEM mode for high resolution imaging as described in the operating manual.
First the condenser lens aperture is inserted and centred. Then the sample is brought into focus and the condenser lens stigmatism is reduced. The HT wobble is performed to make the beam parallel with the optic axis and finally the objective lens stigmatism is minimised and the HRTEM image is captured on the Gatan Oneview camera.
Our Facility: www.analytical...
Our Instruments: www.analytical...
The Microscopy Australia Network: micro.org.au/
Online Electron Microscopy Training: myscope.training/
Produced by Dr Richard F Webster. All microscopy and analysis was performed the Electron Microscope Unit at UNSW - a node of Microscopy Australia and the Mark Wainwright Analytical Centre.

[@PuttaChandraLekha]

Thanks a lot!! It is really helpful for me to complete my TEM course. Excellent demonstration.

[@sandragibson519]

Thank you for adding this video, it is very helpful to see this process start to finish. I just got an F200 and and we are starting to play around with it. I find that the beam position shifts alot with varying magnification or brightness. Is this normal or indicative of a misalignment?