TEM: Alignment of the JEOL F200 TEM for High resolution Imaging
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- Опубликовано: 25 авг 2024
- In this video the JEOL F200 Transmission Electron Microscope is aligned in TEM mode for high resolution imaging as described in the operating manual.
First the condenser lens aperture is inserted and centred. Then the sample is brought into focus and the condenser lens stigmatism is reduced. The HT wobble is performed to make the beam parallel with the optic axis and finally the objective lens stigmatism is minimised and the HRTEM image is captured on the Gatan Oneview camera.
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Video by Dr Richard F Webster
Great tutorial! Do you also have the beam align process with the Anode Wobbler as video tutorial?