New Tools for EBSD Data Collection and Analysis

EDAX has introduced several new products to the Electron Backscatter Diffraction (EBSD) family. The Velocity™ Ultra has been added to the Velocity EBSD Camera Series and is now the world’s fastest EBSD detector, offering indexing speeds up to 6,700 indexed points per second. This high-speed, low-noise CMOS detector is ideal for applications where time to results is critical, including dynamic in-situ experiments and 3D EBSD characterization, while also offerings robust characterization and throughput for both routine and challenging samples. EDAX has also announced the next version of its market-leading OIM Analysis™ software. OIM Analysis v9 has been developed to address the analytical needs resulting from the faster acquisition speeds enabled by the Velocity Detectors. The latest OIM Analysis version offers speed improvements across the board through optimized orientation math calculations, continued multi-threading to take advantage of modern multi-core PCs, and improved data input/output routines. OIM Matrix, the module within OIM Analysis, which uses dynamical diffraction-based simulated EBSD patterns for improved pattern indexing, has also been updated. A new approach, termed Spherical Indexing, has been implemented where experimental EBSD patterns are projected and matched over the spherical surface of the simulated master pattern. The best fit is then used to determine the orientation of the experimental pattern. The approach offers improved EBSD pattern indexing relative to traditional Hough-based indexing while also providing significant indexing speed improvements over the current Dictionary Indexing approach within OIM Matrix™. In this webinar, details, and results from the Velocity Ultra, OIM Analysis v9, and Spherical Indexing will be presented, and the unique benefits to users will be discussed.