Spherical indexing - See how to improve your EBSD data indexing and results

Gatan/EDAX, in conjunction with The Ohio State University Center for Electron Microscopy and Analysis' (CEMAS) 10th-anniversary celebration, invites you to attend this electron backscatter diffraction (EBSD) workshop.
Electron backscatter diffraction (EBSD) is a well-established microanalytical technique for characterizing the crystal orientation of crystallographic materials. Spherical indexing is a new approach to indexing EBSD patterns which significantly improves data quality on deformed or difficult samples.
In this presentation, you will learn:
- How spherical indexing works
- The requirements for spherical indexing
- The advantages of this approach on a range of materials
- How improved orientation precision can better resolve deformed microstructures