How to Get the Most out of Orbis micro-XRF Measurements with Multiple Acquisition Conditions

Measurement of trace elements can be improved by optimizing micro-XRF acquisition conditions. However, it may take more than one set of acquisition conditions to get the best results for various trace elements. Spectral data can be collected under varying conditions on the Orbis micro-XRF system to minimize the effects of background, tube scatter and spectral artifacts. In this webinar, we show some examples using glasses and gemstones, but this technique also has applications in a wide variety of fields including forensics, industrial QC/QA, gemology, geology, metal alloys and more.