Introduction to Electron Probe X-Ray Microanalysis (EPMA) by Dr Jeff Chen

This webinar is presented by Dr Jeff Chen from the Centre for Advanced Microscopy at Australian National University, a Microscopy Australia facility.
Other videos in the series:
Introduction to Quantitative Evaluation of Minerals in the SEM (QEMSEM): • Introduction to Quanti...
Introduction to Energy Dispersive X-Ray (EDXA) Microanalysis: • Introduction to Energy...
EPMA is commonly used to determine the compositions of mineral phases in geological samples but is also used where quantified compositional information is required e.g. metal phases within welds, zoning or compositional variations across minerals or within mineral phases. It is a powerful analytical tool with superior X-ray energy resolution than the commonly used energy dispersive spectroscopy (EDS).
This webinar series is aimed at facility users and requires an understanding of what an SEM is and how it works. If you would like to brush up before the talk you can access our free online module on SEM here: myscope.training/#/SEMlevel_3_1
The Centre for Advanced Microscopy (CAM) provides state-of-the art microscopy and microanalysis equipment to researchers, students and industry partners at the Australian National University (ANU) in Canberra. You can learn more about it here: microscopy.anu.edu.au/
Together, CAM and the CTLab form the Advanced Imaging Precinct and the ANU node of Microscopy Australia, an NCRIS facility, learn more about us here: micro.org.au/about/microscopy...
These videos provide guidance only. Local work health and safety protocols should always take precedence when you undertake any lab procedures in your own facility. Some of the videos show workflows for specific instruments and their content should not be taken as specific instructions for other types of instruments.

[@syedshah5249]

Great job sir

[@dr-rock]

Thank you for the great presentation. Why the sample should be flat? Is it because of X-ray intensity difference depends on the beam direction?

[@jeffchen4016]

Correct! Surface tilt or roughness affects the length of the path of the X-rays have to travel within the sample. The longer the X-rays have to travel within the sample, the more they get absorbed, obviously the less would enter the X-ray detector. Vice versa.

[@adeeljamsheid7917]

I want to buy one for my lab but can't find it on the market can any one help

[@MicroscopyAustralia]

I suggest that you contact JEOL and Cameca, both of whom produce EPMA instruments.

[@jeffchen403]

Shimazu also makes e-probe if you are in Japan