Introduction to focused ion beam scanning electron microscopy (FIB-SEM)

[@paolodomingo3571]

excellent video! thanks a lot for all the effort! it's visually and conceptually very well done! I learned exactly what I needed. looking forward to check out more of your videos

[@gerardogutierrez4911]

By using the FIB to mill away some of the sample to take SEM images to create a 3D image from 2D cross sections, does that destroy the sample? I heard you say that you can redo this to get an information rich image, but I would think the FIB destroys the sample in order to probe the center?

[@NCIgov]

Hi Gerardo, According to Dr. Narayan, who narrated this video, unfortunately FIB milling is inherently destructive, so this simple answer is yes. It may help to think of FIB milling like a deli slicer milling away a very thin slice of the sample. Although that slice is indeed destroyed, the newly exposed surface underneath is now imaged by the SEM. So as you FIB mill your way in small incremental steps though the sample, you are generating a series of SEM images for each of those fresh surfaces, and that's how you get the information rich images of the entire volume. Take care.

[@Drone0]

wow 3D cross section scan of cell

[@changbaoma]

Nice