How to prepare FIB samples for in situ TEM
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- Опубликовано: 11 окт 2024
- This workflow explains the procedure for preparing FIB samples onto a MEMS-based E-chip for in situ TEM. FIB sample preparation can be used to prepare a wide variety of materials for TEM or in situ TEM analysis and is a relatively simple technique to learn. For more information, tips and tricks, and sample preparation guides, visit our library of content at www.protochips.com
Beautiful presentation
Could you please share the information about this FIB model? Thanks!
How do you control the charging on the mems grid?
There are many things you can do to prevent charging, including changing your dose, being mindful of using imaging mode and using low magnifications. If you have more questions, or would like a more in depth discussion, feel free to contact our support email address!
Can this method be used for Poseidon select liquid experiments?
I don't know what they're making, but boy is my mind blown
How can I learn more about this?
Nice
0:32 is a thing of beauty. Control of atoms at the nm scale is the key to unlocking ai and peace
How does the audio not include “yoink” at 1:39?
0p009[⁰0,0😊😊00z😊@@CyrusTabery
How can I use this method if my tip is coming from back side of sem column? In your case it is coming exactly parallel to ion column.
شنو هاي الكلاوات 😂
what the f.. :o