TEM Sample Preparation

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  • Опубликовано: 18 янв 2025

Комментарии • 7

  • @vince0was0here
    @vince0was0here 3 года назад +2

    Great video thanks

  • @derandere3967
    @derandere3967 Год назад

    You mention the low kV thinning necessary to remove implanted gallium. Where does the gallium come from?

    • @oxfordinstruments
      @oxfordinstruments  Год назад

      Thanks for your question. Implanted gallium is a common side effect of FIB sample preparation as Ga Is typically used as the ion source on the FIB.

  • @khaledhaddou311
    @khaledhaddou311 3 года назад

    thank you for detailed information.
    i have a question : is sample preparation for TEM observations different from EBSD sample preparation ? and how so ?

    • @oxfordinstruments
      @oxfordinstruments  3 года назад

      Hi Khaled, in answer to your question, TEM observation and preparation is significantly different from EBSD due to the size of samples and areas of observation.
      EBSD samples look at electron backscattering across often large micron length scales in bulk samples. Details on how EBSD samples are prepared can be read here: www.ebsd.com/14-hints-tips-for-ebsd-data-collection/ebsd-sample-preparation

  • @cockyhieu
    @cockyhieu Год назад

    Do you have the pdf file or ppt file of this lecture sir?

    • @oxfordinstruments
      @oxfordinstruments  Год назад

      Hello and thank you for getting in touch with us. Unfortunately, as it's a Proprietary document, we're unable to share it with you, however, if you have any questions please get in touch with us here > nano.oxinst.com/contact-us