J A Woolam M2000 Ellipsometer highlight video

The ASU Core Research Facilities are proud to introduce the J.A. Woollam M2000 Spectroscopic Ellipsometer, a cutting-edge instrument revolutionizing thin film measurement on wafers.
With the M2000, researchers can accurately determine the thickness of thin films and even obtain the complex refractive index of dielectric films. Its advanced capabilities extend to fitting multiple layers in a stack with precision while covering a wide spectral range from ultraviolet (UV) to near infrared (IR).
Whether you're studying materials of varying thicknesses or exploring the properties of diverse samples, the J.A. Woollam M2000 Ellipsometer is the ultimate tool for your research needs. Two of our Cores, the Eyring Materials Center and Advanced Electronics and Photonics, have an M2000 available for use.
Discover more about this remarkable instrument and unlock its potential for your research by visiting cores.research... or cores.research....