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Eyring Materials Center
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Добавлен 9 мар 2016
Instrument training videos for the Eyring Materials Center instruments. #EyringCenter
Rigaku SmartLab training video to so GXRD and XRR.
Video showing how to use SmartLab Studio II to measure grazing incidence X-ray diffraction and x-ray reflectivity on thin film samples.
Просмотров: 1 622
Видео
Using the PerkinElmer Frontier FTIR with the Pike Diamond ATR
Просмотров 54011 месяцев назад
Training video to measure powders and liquids on the diamond ATR with the Frontier FTIR instrument. For more info on our instrument check out our website here: cores.research.asu.edu/materials/equipment/FTIR
Helios 5UX - SEM training video
Просмотров 815Год назад
Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the basic SEM aspect of the microscope. For more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific related video: ruclips.net/video/WrxZ3k8i7uM/видео.html
Helios 5UX - FIB training
Просмотров 1,3 тыс.Год назад
Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the FIB aspect of the microscope. for more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific Related video: ruclips.net/video/kngtBYSN2Q4/видео.html
J A Woolam M2000 Ellipsometer highlight video
Просмотров 369Год назад
The ASU Core Research Facilities are proud to introduce the J.A. Woollam M2000 Spectroscopic Ellipsometer, a cutting-edge instrument revolutionizing thin film measurement on wafers. With the M2000, researchers can accurately determine the thickness of thin films and even obtain the complex refractive index of dielectric films. Its advanced capabilities extend to fitting multiple layers in a sta...
FEI TEM holder insertion and removal training.
Просмотров 279Год назад
This training video describes inserting and removing a TEM holder from a FEI / Thermo Fisher Scientific TEM. We also emphasize a few elements to help you avoid crashing the microscope vacuum.
Nion ultra STEM 100 training video.
Просмотров 514Год назад
Introductory training video for our NION ultra STEM 100 Scanning Transmission Electron Microscope.
ASU Core Facilities Equipment Showcase: Talos L120C
Просмотров 243Год назад
The ASU Core Research Facilities house state-of-the-art equipment, including including the Talos L120C transmission electron microscope. This instrument images both negatively stained or resin biological samples at accelerating voltages of either 80 or 120 kV. The Talos is capable of long-term data collection, such as Serial EM, because of its large liquid nitrogen dewar. As a research institut...
Zeiss Auriga SEM training video
Просмотров 2,7 тыс.Год назад
Training video for our Zeiss Auriga dual beam FIB/SEM. The video covers basic SEM operations from sample loading to image optimization. For more info on our instrument, check our website: cores.research.asu.edu/materials/equipment/semfib-focussed-ion-beam-auriga-zeiss
Ion beam accelerator highlight Video
Просмотров 1,4 тыс.Год назад
Video highlighting our 1.7 MeV tandem accelerator and analysis chamber where thin film samples can be analyzed using Rutherford Backscattering and other techniques. More information here: cores.research.asu.edu/materials/equipment/ion-beam-analysis-materials-ibeam
Eyring Materials Center Kratos axis supra+ instrument highlight
Просмотров 118Год назад
Our Kratos Axis supra is a state-of-the-art X-ray photoelectron spectroscopy (XPS) instrument with UPS, ISS measurement capabilities, and an argon cluster gun for gentle sample cleaning and depth profiling. More information here: cores.research.asu.edu/materials/equipment/x-ray-photoelectron-spectroscopy
ARM200F sTEM training video
Просмотров 3,1 тыс.2 года назад
STEM imaging on ASU's probe corrected ARM200F training video. The video is for basic imaging. More information here: cores.research.asu.edu/materials/equipment/temstem-arm200f-jeol
XPS presentation Guo 04 01 2022
Просмотров 4462 года назад
Introduction to XPS and our new Kratos Axis Supra instrument.
Bruker IFS 66V/S FTIR training
Просмотров 6052 года назад
Training video describing how to operate the Bruker IFS66V/S FTIR system with the diamond ATR module. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For information specific to the EMC's Fourier-transform infrared spectroscopy (FTIR) capabilities, please visit: cores.research.asu.edu...
Using the Lambda 950 UV-vis spectrometer to analyze small samples - updated
Просмотров 1,5 тыс.2 года назад
A companion to our Lambda 950 training video (ruclips.net/video/8tGhqVwi-Qc/видео.html ) aimed at helping to analyze small samples on the Lambda 950 in both transmission and reflectance mode. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For more information on the EMC's UV-Vis spec...
Helios 5 UX capabilities Highlight video
Просмотров 6532 года назад
Helios 5 UX capabilities Highlight video
ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
Просмотров 4082 года назад
ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
ASU's Nion Microscope: Even more powerful with a new electron detector
Просмотров 6092 года назад
ASU's Nion Microscope: Even more powerful with a new electron detector
Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
Просмотров 2,8 тыс.3 года назад
Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
Просмотров 1,9 тыс.3 года назад
Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
Practical introduction to X-ray diffraction - Introduction - video 1 of 4
Просмотров 5663 года назад
Practical introduction to X-ray diffraction - Introduction - video 1 of 4
Setaram Labsys EVO (DTA mode) training video
Просмотров 2,9 тыс.3 года назад
Setaram Labsys EVO (DTA mode) training video
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
Просмотров 1,4 тыс.4 года назад
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
PerkinElmer Frontier FTIR training video
Просмотров 9 тыс.4 года назад
PerkinElmer Frontier FTIR training video
Hi how we can process the data on open free source software for this instruments
where is the thickness value of the film from the data analysis?
amazing video, thank you so much really
Thanks very good
Do u know ABF ?
Crystally clear explanations. Thank you!
Thanks for the video! When you were measuring the reflectance, what is there in the 2 holders you are refering to as the reference and the sample? What is the chemical composition on them? Also, is it not necessary to run any baseline scan for this reflectance mode? Does it not have anything to do with the BaSO4 baseline?
Thank you! Great video!
HELPFUL and INSTRUCTIVE!
Why I can't find the integral gain and the proportional gain parameter ? (I use the mechanical properties mode)
Hi. If you are using Any Peak Force mode, the gains are being set automatically as you scan. In tapping mode they will appear on the Scan Parameters list of values to change.
I would like to ask, is there any need to change the drive amplitude and amplitude set point when using tapping mode? I am quite new to AFM. I normally change these parameters but cannot seem to get consistent images most of the time. This is the first guide I've seen in which these parameters were not changed.
Typically, you can set it and forget it! When using tapping mode, the setpoint can be decreased on samples that require greater tapping force. If your probe is tending to come off the sample surface, you should increase the tapping force. Also, make sure you're using the best probe for the sample.
@@EyringMaterialsCenter So Ideally, I can match the trace and retrace by changing the proportional and integral gains as pointed out in the video?
@@darylldalayoan4880 yes that is the goal to get good images.
Alhamdulillah
Do we need to enter the value of omega offset in the Sample offsets field under User Settings tab before starting the gonio scan?
sir how to calculate lattice parameter of composite film Polyvinyl Achohol (PVA)-LaFeO3 with different concentrations
What are the dimensions of the container for the aerosol sample?
The standard TEM grid has a size of 3 mm in diameter.
How long does it take to take a photo with an ETEM microscope? What if it is an aerosol sample? How to prepare an aerosol sample? How do you get an aerosol sample into a cell?
Thanks for this video. It helped me a lot. I would also like to see training videos on Witech AFM and Confocal microscopy.
Great, thanks
As per you the system without ATR can solve the problem of checking transmission of germanium,silicon window.
All you would need to do is place the window in the beam path during the measurement. No special accessory is needed.
is ATR necessary for checking of transmission of germanium or silicon window?
It is not recommended. A straight-through transmission if preferred. The ATR would only provide information about the surface of the material being analyzed.
Thankyou
how we check the transmissiin of ir coatrd windows made of germanium , silicon,etc
Hi Manan, assuming the window is transparent enough, which should be the case, you can do a straight through measurement by mounting the window on the steel holder shown around 1:33 on the video. You can use tape to mount the sample as long as the beam does not go through the tape.
@@EyringMaterialsCenter is ATR required for this?
@@manojdhiman5694 I would not use the ATR for it unless you are only interested in analyzing the coating.
Good topics
Kindly upload a alignment video
SEC Tabletop SEM SNE 4500 Series are most functionalized and high resolution mode in tabletop series. 5nm Resolution and 150.000 X Actual Magnification and strong at outside vibration factors. It is a easiest operation and multi user adaptable models in Tabletop SEM. #SEc Europe #Tabletopsem #www.tabletopsem.com
How to align the device, one video tutorial please
thank you very much
It is a great video training . ^^ We are SEC Europe Head Office. -tabletopsem -Tischrem - Nanotech digital GmbH (SEC Europe) www.nanotechdigitalgmbh.com
Thanks a lot for this helpful video. Keep up the good work.
Hello, how can I get User name and password for Perkinelmer. I already used administrator but it's not working
Hi Roman, The system owner should have access to doing that. Otherwise, I would suggest contacting PerkinElmer's customer service. Good luck!
Hello, could you make a video on data analysis on emissions/how to read on the Spectrum software? Thanks
This is really helpful. Do you have any tips that can be followed to focus the instrument? I face hard time when i start that focus step. Thanks.
Great explanation and very straightforward!
Nice. Very useful
please how to determine the crystal structure of the sample from High Score?
Hi, thank you for your nice video, it's very helpful. I just wanna ask , if I wanna take blank sample (ITO glass) so where is the place for blank sample?
Hi, is it possible to measure the absolute optical power or intensity of the light falling on the sample in Lambda 950,?.
Strain and size analysis?
Odebowale I suggest checking out the information at J.A. Woollam's website. They have a very nice tutorial and offer classes on data analysis. Good luck
reaally enjoy the video. can you please send me reference material on WVASE Ellipsometry dataanalysis
im having having a hard time to interpret the results i got from XRD analysis. Please any help!
Hi Sir a useful video but i face some problems in my High plus software before i used it for many analysis but now as i did all of the step finally after selecting the target elements in the periodic table and click search so a message appear that no candidate found so plz tell me that what i should do, i reinstall but still not ok.
I see that you saw my response below. You might need to contact PANalytical for help they have excellent customer service.
how much is it ?
I do not have the current price. Please contact the PANalytical sales office for pricing information.
how much was it ?
Hi, how are u? when I choose some possible elements and click search, I get this message: No candidates found. What is the problem?
The issure can be a number of things. Make sure you have the PDF database on the computer you are using. If you are unsure of the elements present make sure they are selected in grey rather than green.
hi hasti have you solve the problem? i have the same problem as yours? by using the software ?
Hi thanks for your answer. I still have the same problem. I have PDF file on the the computer and I have imported them correctly because I can see the number of patterns which is a big one. but I still receive the same msg although I am sure about my the elements I chose
Hi how are u? I still have this problem:( did u find anything to solve it? let me know please and I will let you know too thanks
how to download this software, i am searched it so many time in google but it is not available trial version also.. kindly help me... my email id is ns.rathinonly4u@gmail.com
Hi Naresh, Please contact PANalytical, this program is sold by them.
how to download PANalytical X'Pert HighScore Plus? thanks
HighScore Plus must be purchased from PANalytical.