Single particle interferometric reflectance imaging sensor to characterize extracellular vesicles

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  • Опубликовано: 14 апр 2024
  • Lecture about single particle interferometric reflectance imaging sensor (SP-IRIS) to characterize extracellular vesicles (EVs) (AFM) by Olesia Gololobova and Kenneth W. Witwer as part of the third massive online open course (MOOC) of the International Society for Extracellular Vesicles (ISEV). The lecture covers the basic principles of SP-IRIS, how to interpret the measured signals, practical information, assay controls, do’s and don’ts as well as examples.
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