Can this method be used to test a sample which is in an overhead position? I've seen that there are many devices out there in the market which make that claim, however with reference to the Leeb cycle, an overhead position will not give a second curve therefore the device will not produce a reading.
Can this method be used to test a sample which is in an overhead position? I've seen that there are many devices out there in the market which make that claim, however with reference to the Leeb cycle, an overhead position will not give a second curve therefore the device will not produce a reading.