Ellipsometry & CompleteEASE Part1: Fitting basics for transparent films

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  • Опубликовано: 30 янв 2025

Комментарии • 5

  • @MohammedIslamElshiekhElsmani
    @MohammedIslamElshiekhElsmani 3 года назад +1

    Interesting!!

  • @saisandeeplolla5967
    @saisandeeplolla5967 3 года назад

    Thank you for the video. If I may, can you please tell me about how to infer the uniformity of a measured layer using the parameters obtained. Do MSE (mean squared error) and thickness confidence have to do anything with this? Thank you

  • @daninil1
    @daninil1 5 лет назад

    Thanks for the video. Is there any way of doing a global fit in such a way that the optical parameters are the same for all the positions, but that the thickness can vary? I know it is possible if you first fit the optical parameters and then use that to only look at the thickness.

    • @thekavlinanoscienceinstitu9490
      @thekavlinanoscienceinstitu9490  5 лет назад +1

      Yes, that's correct. You would fit the optical parameters at one measurement point and then keep them constant while you perform a global fit (fit scan data) with thickness as the only parameter to be fit. You might do something like that if your fit is very good and is showing that your index is essentially unchanged across the scanned region. Though you will probably find that in most cases this barely has an effect on the thicknesses reported at each scan point if the fit is already very good.

  • @jl8486
    @jl8486 2 года назад

    Hello the range of fitting is from 400 to 1000nm, would it be more accurate if increase the range from 400 to 2000nm? Thanks a lot.