Part 1: Surface Profiler for Film Thickness Measurement (DekTakXT Bruker)
HTML-код
- Опубликовано: 22 июн 2020
- Created by Mohd Azwadi Bin Omar
Coordinated by Dr Soon Chin Fhong
--------------------------------------
Microelectronic and Nanotechnology-Shamsuddin Research Center
Institute for Integrated Engineering
Universiti Tun Hussein Onn Malaysia
86400 Parit Raja,
Batu Pahat,
Johor.
Malaysia
