Live from the Lab: Thin Film Thickness and More with DIFFRAC.XRR
HTML-код
- Опубликовано: 19 дек 2024
- Thin films are often applied to surfaces to modify their properties. They are also used to create next generation sensors and microelectronic devices. As the thickness of films approach nanometer scales, it is important to have a tool for quantifying their thickness. X-ray Reflectometry (XRR) is a method used to quantify the thickness, density and roughness of thin films. In this episode of Live from the Lab we will discuss XRR and see how to analyze measurements in DIFFRAC.XRR.
Thank you for making an excellent informative video but I do want know to about the weight in the range (which you are using 2 or 3).
1) why are you estimating that number only?
2) what is the role of the weight?
Hi Nitesh. Ranges are used to define 2-theta regions where the fit is evaluated. Weight is used to give one range preference over another - i.e. During the fit calculation, datapoints contained in a range with weight of 2 is effectively given twice the consideration of the datapoints contained in a range with weight of 1.
Thanks for the really interesting and useful video!
A couple of questions concerning interface roughness model:
1. Does the software uses the Graded-interface approach for Erf, Linear and Sin models (i.e. interface is represented as a gradual change in the refractive index using many thin layers)?
2. If “yes” then what is the discretization thickness?
Greetings! Thank you for watching and for your question. For an abrupt interface, the influence of roughness is calculated analytically. For gradients the interface is subdivided into a number of thin layers.