MEPTEC
MEPTEC
  • Видео 128
  • Просмотров 109 320

Видео

The Role of Machine Learning in Electronic Design Automation
Просмотров 263Месяц назад
MEPTEC AI for Semiconductor -
Accelerating PCB design with AI
Просмотров 120Месяц назад
MEPTEC AI for Semiconductor -
Finding the Needle in the Haystack - on the Use of AI in Defect Analysis
Просмотров 80Месяц назад
MEPTEC AI for Semiconductor -
Big strides in electronics test and production using algorithmic methods to unsupervised ML
Просмотров 95Месяц назад
MEPTEC AI for Semiconductor -
Infrastructure and Applications for AI in Semiconductor Test
Просмотров 95Месяц назад
MEPTEC AI for Semiconductor -
Implementing Real-time AI in High Volume Test
Просмотров 48Месяц назад
MEPTEC AI for Semiconductor -
Not Just Chips: Novel Techniques for IC Integration and Packaging Using Additive Technologies
Просмотров 470Год назад
Novel Techniques for IC Integration and Packaging Using Additive Technologies Patricia Beck NextFlex Flexible Hybrid Electronics (FHE) combines a variety of processes coming from industries such as conventional electronics manufacturing, printing, plastics processing, additive manufacturing, laser imaging and robotic assembly. It combines thinned dies, printed components, flexible, conformal ma...
Not just Chips: Metal Gel conductor offers increased durability for hard to soft interfaces in...
Просмотров 131Год назад
Metal Gel conductor offers increased durability for hard to soft interfaces in Flexible Hybrid Electronics (FHE) Sai Srinivas Liquid Wire Continuous and real-time monitoring of biopotential and physiological signals is enabled by body-worn electronics, but the adoption of these electronics has been limited because their rigid shape and structure tend to impose restrictions on human body motions...
Not Just Chips: Retrospective on MEMS packaging - challenges to be considered / chalenges to be...
Просмотров 322Год назад
Retrospective on MEMS packaging - challenges to be considered / chalenges to be solved (market needs) Doug Sparks The evolution of MEMS packaging will be covered, spanning early pressure sensors in the 1960's that used metal TO cans & custom industrial sensors to plastic automotive packaging starting in the 1980s -1990s with pressure, flow, acceleration sensors and gyroscopes. The talk will the...
Not Just Chips: Packaging of Sensors for High Reliability, Survival and Performance in Extreme...
Просмотров 184Год назад
Packaging of Sensors for High Reliability, Survival and Performance in Extreme Environments Nicholas Tiliakos Innoveering-GE Aerospace Designing sensor packaging for extreme environments (eg. high temperature, oxidizing, high pressure applications) requires understanding the environment and its underlying physics but also accounting for its effects on the sensor’s packaging material selection, ...
Not Just Chips: MEMS & Sensors Packagingand Interconnect - Session Overview and Introduction
Просмотров 83Год назад
Session Overview & Introduction Roger H. Grace Roger Grace Associates
Not Just Chips: Challenges to Develop a Reliable Lead Free Solder Column To Replace Solder...
Просмотров 256Год назад
Challenges to Develop a Reliable Lead Free Solder Column To Replace Solder Balls in Large Heterogeneous Packages Martin ("Marty") Hart Topline Corporation Solder balls are well suited for interconnecting normal sized ball-grid array (BGA) components to printed circuit boards (PCB). However, solder balls may be subject to failure (delamination) caused by excessive stresses inherently found in su...
Not Just Chips: Solving Moore’s law Packaging Challenges
Просмотров 663Год назад
Solving Moore’s law Packaging Challenges Alfed Zinn Kuprion Inc The electronics industry is undergoing a major paradigm shift since Moore’s law has been laid to rest with the last published ITRS in 2016. Shifting from CMOS scaling to a packaging focus allows a continuation of Moore’s law and economic growth for decades to come: continuing miniaturization by cramming more functionality onto a sm...
Not Just Chips: Enabling high volume data communication - solving the new challenges in PIC wafer...
Просмотров 319Год назад
Enabling high volume data communication - solving the new challenges in PIC wafer testing Tobias Gnausch JENOPTIK · Advanced Photonic Solutions Thanks to Photonic Integrated Circuits (PICs), optics is becoming the key to fast data communication. Although not entirely new, PICs are an important future technology. They are already being used to implement applications such as data transceivers, ge...
Not Just Chips: Silicon Photonics Chiplet Package - Optical Assembly
Просмотров 4,5 тыс.Год назад
Not Just Chips: Silicon Photonics Chiplet Package - Optical Assembly
Not Just Chips: 3D IC Test Strategy
Просмотров 720Год назад
Not Just Chips: 3D IC Test Strategy
Not Just Chips: Assembly Solutions for Cost Effective Heterogeneous Integration with Disparate...
Просмотров 309Год назад
Not Just Chips: Assembly Solutions for Cost Effective Heterogeneous Integration with Disparate...
Not Just Chips: Signal Integrity Analysis at the Dawn of the Interposer Era
Просмотров 806Год назад
Not Just Chips: Signal Integrity Analysis at the Dawn of the Interposer Era
Not Just Chips: The Challenges of Scaling Beyond Moore’s Law and Into the World of 3DHI
Просмотров 1,4 тыс.Год назад
Not Just Chips: The Challenges of Scaling Beyond Moore’s Law and Into the World of 3DHI
Bringing sexy back to US heterogeneous integration manufacturing
Просмотров 239Год назад
Bringing sexy back to US heterogeneous integration manufacturing
Outlook for 2023: When and Where Will Growth Return? - Jan Vardaman
Просмотров 586Год назад
Outlook for 2023: When and Where Will Growth Return? - Jan Vardaman
How is Industry Uncertainty Impacting MEMS Commercialization: Results of the Annual MEMS...
Просмотров 162Год назад
How is Industry Uncertainty Impacting MEMS Commercialization: Results of the Annual MEMS...
KGx - Paneldiscussion
Просмотров 156Год назад
KGx - Paneldiscussion
KGx - Marc Hutner: Elevating KGD with Deep Data Analytics
Просмотров 224Год назад
KGx - Marc Hutner: Elevating KGD with Deep Data Analytics
KGx - Tom Katsioulas: Component-based supply chain provenance, traceability and digital thread of...
Просмотров 250Год назад
KGx - Tom Katsioulas: Component-based supply chain provenance, traceability and digital thread of...
KGx - Jay Rathert: Quality Screening: Concepts and advances for using IC Manufacturing Defect...
Просмотров 482Год назад
KGx - Jay Rathert: Quality Screening: Concepts and advances for using IC Manufacturing Defect...
Design Integration: Substrate Design Optimization for Chiplet Architecture
Просмотров 8212 года назад
Design Integration: Substrate Design Optimization for Chiplet Architecture
Paneldicussion: Design Integration : Current Status and Future Directions
Просмотров 2882 года назад
Paneldicussion: Design Integration : Current Status and Future Directions
Design Integration: Universal Chiplet Interconnect Express (UCIe)
Просмотров 3,8 тыс.2 года назад
Design Integration: Universal Chiplet Interconnect Express (UCIe)