PinPoint Mode | How AFM Works - Principle of Atomic Force Microscopy

PinPoint mode is an imaging method in AFM that differs from contact and non-contact modes. While contact and non-contact modes rasterize horizontally the sample to measure its features, PinPoint mode operates by vertically approaching and retracting the AFM probe at each designated points. This method captures detailed surface information of the sample, measuring topographical features and obtaining various nanomechanical information.
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[@pabloares5028]

Nice animations, but in life it is appropriate to cite those who made a job before you. Pedro J. de Pablo et al. invented Jumping Mode (PinPoint Mode seems to do exactly the same)... at the end of the last century!:
P. J. de Pablo et al. Jumping mode scanning force microscopy. Appl. Phys. Lett. 73, 3300-3302 (1998)

[@miguelmorenougeda342]

@Park Systems: the wheel was invented long time ago. Congrats for the reinvention! 😅