DDN User Conference at SC22: Krishna Muriki, KLA - Finding Nano-Scale Needles in a Peta-Scale

Krishna Muriki is HPC Architect/Systems Design Engineer at KLA, which supplies process control and yield management systems for the semiconductor industry. Here he discusses the challenges of manufacturing silicon chips at scale - in particular, how to check a foot-wide silicon wafer for defects that are just a few nanometers in size. Muriki explains that KLA’s vision inspection systems need to scan entire wafers at high speed for real-time defect analysis and archive the images long-term for process diagnostics and machine learning.
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