@pauldenisowski: Could you please comment, if using SMU as a source current biasing unit for an on-chip local oscillator, how much flicker noise would be contributed from the SMU. I am assuming the current sources inside the SMU instrument would be CMOS based.
I would refer you to the specifications. Some amount of "noise" (or ripple) is present in all power supplies, and that would be the figure of merit in this case. In my experience, it's only really possible to measure noise generically, although if you plot the distribution of the noise, it often has "regions" where the contribution is primarily due to a certain mechanism, such as flicker noise, random walk, etc.
@@pauldenisowski Your name echoes down the hallways of many engineering labs. Your voice shepherds metrological prowess across the discipline. "Legend" is modest.
very nice presentation. Thanks a lot.
Thanks!
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@pauldenisowski: Could you please comment, if using SMU as a source current biasing unit for an on-chip local oscillator, how much flicker noise would be contributed from the SMU. I am assuming the current sources inside the SMU instrument would be CMOS based.
I would refer you to the specifications. Some amount of "noise" (or ripple) is present in all power supplies, and that would be the figure of merit in this case. In my experience, it's only really possible to measure noise generically, although if you plot the distribution of the noise, it often has "regions" where the contribution is primarily due to a certain mechanism, such as flicker noise, random walk, etc.
Thank you very much, Rohde Schwarz.
Thanks for the feedback!
Paul Denisowski is a legend
Thank you! But "legend" is maybe a bit much :)
@@pauldenisowski Your name echoes down the hallways of many engineering labs. Your voice shepherds metrological prowess across the discipline. "Legend" is modest.