Very impressed with the details and how the information was delivered. I wish that I had such a wonderful lecturer when I was an undergraduate student. Thank you for making the EM information accessible to other scientists.
🎯 Key Takeaways for quick navigation: Electron microscopes consist of various lens systems: electron gun, condenser lens, objective lens, and projector lens. The objective lens system produces a magnified image of the sample, further magnified by the projector lens system. Multiple lenses in electron microscopes compound magnification, enabling high-resolution imaging. Deflectors, lenses, stigmators, and apertures are key components of each lens system. Controlling parameters such as filament current, voltage bias, and lens currents affect image quality and magnification. Spot size and intensity control affect beam coherence and brightness on the sample. Specimen holders allow control of sample position, height, tilt, and rotation. Alignment of deflectors ensures the electron beam passes through the optical axis of each lens system. Calibration ensures accurate response to commands for beam shifts and tilts. Hysteresis in lens systems can lead to variations in imaging conditions, necessitating normalization procedures. Made with HARPA AI
It seems like you could compensate for result Deltas in magnification range changes by modifying the thermal heating/cooling effect of the "water cooling" system of In. (don't cool a lens that's not active in LM or M modes)
Very impressed with the details and how the information was delivered. I wish that I had such a wonderful lecturer when I was an undergraduate student. Thank you for making the EM information accessible to other scientists.
This is all that you need to know before going to the Microscopy room. Wonderfull explanation. Thank you so much Jensen. 😃
Nice. It's really kind of you to give this kind of lecture.
🎯 Key Takeaways for quick navigation:
Electron microscopes consist of various lens systems: electron gun, condenser lens, objective lens, and projector lens.
The objective lens system produces a magnified image of the sample, further magnified by the projector lens system.
Multiple lenses in electron microscopes compound magnification, enabling high-resolution imaging.
Deflectors, lenses, stigmators, and apertures are key components of each lens system.
Controlling parameters such as filament current, voltage bias, and lens currents affect image quality and magnification.
Spot size and intensity control affect beam coherence and brightness on the sample.
Specimen holders allow control of sample position, height, tilt, and rotation.
Alignment of deflectors ensures the electron beam passes through the optical axis of each lens system.
Calibration ensures accurate response to commands for beam shifts and tilts.
Hysteresis in lens systems can lead to variations in imaging conditions, necessitating normalization procedures.
Made with HARPA AI
It seems like you could compensate for result Deltas in magnification range changes by modifying the thermal heating/cooling effect of the "water cooling" system of In. (don't cool a lens that's not active in LM or M modes)
Can you adjust tilt on x and y or are you limited to the axis of the "spatula handle"? (~10:45)
5:50