Tessent test coverage debug 1

This is the first in a series of four videos on Tessent Design for Test (DFT) and how to understand and debug test coverage issues in the Tessent ATPG tools.
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ABOUT TESSENT SILICON LIFEYCYCLE SOLUTIONS
Tessent Silicon Lifecycle Solutions (formerly Mentor Graphics/UltraSoc) is a division of Siemens EDA (Siemens Digital Industries Software).
Tessent are widely recognized as the industry market leader in delivering design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle. Tessent solutions help customers address their debug, test, yield, safety, security and optimization requirements for today’s most complex SoCs.
Tessent solutions fall into 2 key categories, Tessent Test and Tessent Embedded Analytics.
TESSENT TEST | Design for Test (DFT) and Yield Learning
DFT and yield learning products for logic, memory and mixed-signal devices.
The Tessent Test product suite provides comprehensive silicon test and yield learning applications that addresses the challenges of manufacturing test, debug, and yield ramp.
TESSENT EMBEDDED ANALYTICS | SoC Debug and Analytics
Tessent Embedded Analytics provides solutions for real-time debug and post-deployment analytics for RISC-V-based and other complex SoCs.
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LEARN MORE
Visit the Tessent website: www. eda.sw.siemens...
Email: [e-mail]
#DFTmarketleader

[@akashsaxena751]

Very Nicely elaborated and dictated. Can we also get the transcript for this video, so we can relate the explaining with the text ?