Secondary Ion Mass Spectroscopy | SIMS | Semicondcutor Characterization | Academic Talks
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- Опубликовано: 8 фев 2025
- This video lecture describes the 'Secondary Ion Mass Spectroscopy' i.e SIMS, used for characterization of semicondcutors materials.
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Excellent and information rich introduction to SIMS. Thank you🙏
Very good explanation
A step not explained here is why the ejected material is ionic rather than atomic. Is there are transfer of electrons between sample and beam (i.e. primary ions become atoms by ionizing sample atoms)?
sir what is craters edge effect?
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14
34
Kajal22
Puja 33
Anchla(20)
Arti Sharma (32)
Pooja(17)
Sonia 26
Ritu(01)
Mahender(39)
Vaishali (38)
Parveen 15
Vipin 31
Karan02
Mayank(40)
kunal 11
Anju 25
Harsh 24
14
34
Kajal22
Puja 33
Gaurav roll no 21
Jyoti(21)
Prerna (36)
Mayank(40)
Arti Sharma (32)
Mandeep(16)
Chhavi (41)
Vaishali (38)
Prerna (36)