Advanced EDS Data Processing in Velox: Ensuring Accurate Quantification

Welcome back to our ongoing series on EDS data processing in Velox. In this video, we delve deeper into the tools and techniques that will ensure your dataset is primed for accurate quantification.
We'll walk you through the process of evaluating the quality of your dataset, identifying potential sample damage during acquisition, and optimizing the final result by controlling individual detector streams from Super-X and Ultra-X.
We'll use a sample of Silicon with SiGe lines, previously featured in our videos, to provide a consistent reference and demonstrate the various steps involved in the process.
You'll learn how to examine and identify the spectrum present in individual pixels, using the Spectrum Integration tool on region of interest. We'll also show you how to optimize the final result by controlling the individual detector streams from Super-X and Ultra-X.
We'll highlight the importance of inspecting frames and how Velox's time-resolved acquisition feature can ensure all your data is saved securely. We'll also guide you on how to deselect frames and segments to avoid potential inaccuracies in your dataset.
By the end of this video, you'll be well-equipped to move forward with generating high quality elemental maps or diving into more advanced analysis techniques.
This video also supports multiple language subtitles. Stay tuned for our upcoming videos where we'll explore more details about quantification.
Please note: This specific video tutorial is most valuable for those using Super-X G2 and Ultra-X hardware platforms, as some features may not be available on other platforms. And remember to download latest version of Velox from www.fei-softwa...
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