Electron Tube
Electron Tube
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14.25. Lifetime of a chip
The reliability of microchips goes in phases. Behavior in early life is substantially different from that in useful life, and the wear out stage indicates the product is exiting the market. Understanding the features of each phase is important to the management of design goals.
Просмотров: 1 815

Видео

14.24. Reliability of VLSI systems
Просмотров 2,4 тыс.4 года назад
Reliability is at once related to and distinct from testing. Reliability reflects on the behavior of a system or component over time. It is related to defects that accumulate or worsen over time. Some measure of unreliability is inevitable in VLSI.
14.23. Finding and solving dynamic hazards
Просмотров 5 тыс.4 года назад
Dynamic hazards can be detected and solved from equations in a very similar way to static hazards. However, the entanglement of static and dynamic hazards must be approached very carefully because you might miss inadvertently miss some glitches.
14.22. Anatomy of dynamic hazards
Просмотров 1,5 тыс.4 года назад
Dynamic hazards are much harder to discover and deal with than static hazards. However, once we realize that dynamic hazards are essentially transitions with an embedded static hazard, things start to get much better.
14.21. Static hazards in complex circuits
Просмотров 1,2 тыс.4 года назад
We take a deeper look at how complicated logic circuits can be made glitch free. This requires a good understanding of how equations translate into differential paths through the circuit.
14.20. Static hazards in logic equations
Просмотров 1,9 тыс.4 года назад
Using Karnaugh maps or logic circuits to detect and solve static hazards is not a scalable approach. As the number of input variables increase, K-maps become untenable. Fortunately, there are very easy ways to detect the possibility of glitches straight from logic equations.
14.19. Static-0 hazards
Просмотров 2,4 тыс.4 года назад
Static-0 hazards are very similar to static-1 hazards. They come from very similar sources and are solved in very similar ways. However, because the stable zero at the output is a result of an AND gate instead of an OR gate, we must approach the problem a little differently.
14.18. Static-1 hazards
Просмотров 2 тыс.4 года назад
Static-1 hazards occur when you expect the output of a circuit to remain stable at '1', but it temporarily glitches down to zero. This occurs due to differential delay through the circuit and is easily visible from Karnaugh maps.
14.17. Glitches and logical hazards
Просмотров 2,9 тыс.4 года назад
Glitches are unexpected peaks and dips in logic outputs from combinational circuits. We would normally not care about the appearance of these glitches in synchronous pipelines, but in latch loops and asynchronous circuits they can be devastating.
14.16. Boundary scan & JTAG
Просмотров 6 тыс.4 года назад
The boundary scan technique allows us to probe pins of chips connected to PCBs. The standard used to manage boundary scan is called JTAG. While boundary scan is mainly used to test copper tracks and soldering connections on PCBs, it can be combined with other DFT techniques to test individual chips.
14.15. PCB design & fabrication
Просмотров 1,2 тыс.4 года назад
Printed Circuit Boards are used to combine multiple ICs with passive components to form a bigger system. The design and fabrication of PCBs has a lot of parallels to the design and fabrication of microchips, albeit much simpler and at much larger dimensions.
14.14. IC package types
Просмотров 2,2 тыс.4 года назад
There are many IC package types to choose from. However, finding one that fits exactly to the needs of your die isn't always simple. There is always a tradeoff between simplicity and the number of pins you need, making it even more imperative that you have good pin economy.
14.13. IC packaging
Просмотров 2,1 тыс.4 года назад
When you buy a microchip, it does not come as an exposed die. It comes in a tight little plastic container. This is the IC package, and for something so seemingly simple, we certainly expect it to do a whole lot of things.
14.12. Testing memories: coupling & NPSF
Просмотров 3,1 тыс.4 года назад
Simple fault models like the stuck at fault model are a good starting point for representing memory faults. However, realistic models are significantly complicated by the fact that most memory faults involve interactions between multiple cells.
14.11. Testing memories: stuck at & transition faults
Просмотров 5 тыс.4 года назад
Memories are designed with fundamentally unique metrics in mind. Thus, testing memories has to be different from testing random logic. Memories have one thing going for them: they have to do something very simple to be functional: write and read a '0', and write and read a '1'. But that is where the simplicity ends.
14.10. Built In Self Tests
Просмотров 5 тыс.4 года назад
14.10. Built In Self Tests
14.9. Automatic Test Pattern Generation
Просмотров 11 тыс.4 года назад
14.9. Automatic Test Pattern Generation
14.8. SCAN path technique
Просмотров 10 тыс.4 года назад
14.8. SCAN path technique
14.7. SCAN registers
Просмотров 6 тыс.4 года назад
14.7. SCAN registers
14.6. Stuck open/short fault model
Просмотров 9 тыс.4 года назад
14.6. Stuck open/short fault model
14.5. Stuck at fault model
Просмотров 16 тыс.4 года назад
14.5. Stuck at fault model
14.4. Yield, Defect Level, and Fault Coverage
Просмотров 7 тыс.4 года назад
14.4. Yield, Defect Level, and Fault Coverage
14.3. Test Design and Fault Coverage
Просмотров 8 тыс.4 года назад
14.3. Test Design and Fault Coverage
14.2. Defects, Faults, and Errors
Просмотров 10 тыс.4 года назад
14.2. Defects, Faults, and Errors
14.1. Design for Testability
Просмотров 35 тыс.4 года назад
14.1. Design for Testability
13.14. Asynchronous FIFOs
Просмотров 15 тыс.4 года назад
13.14. Asynchronous FIFOs
13.13. Synchronizers & synchronization
Просмотров 1,9 тыс.4 года назад
13.13. Synchronizers & synchronization
13.12. Statistics of metastability
Просмотров 9604 года назад
13.12. Statistics of metastability
13.11. Metastability
Просмотров 1,8 тыс.4 года назад
13.11. Metastability
13.10. Clock distribution networks
Просмотров 2 тыс.4 года назад
13.10. Clock distribution networks

Комментарии

  • @TheAhmedAbdulkadir
    @TheAhmedAbdulkadir 6 дней назад

    Thanks! Very informative

  • @luphiax4239
    @luphiax4239 20 дней назад

    how can you have only 7660 subscribers? You are amazing

  • @pallakishoreyadav4537
    @pallakishoreyadav4537 Месяц назад

    wont it be positive raising exponetial

  • @andreiamg8393
    @andreiamg8393 Месяц назад

    At 10:30 you say that If we hit the end of the process and there are transactions that did not turn into events they are canceled. - I think this is not correct in all cases. Example is a clock generation process that starts with the wait statement and then is the signal assignment.

  • @samaygoel707
    @samaygoel707 Месяц назад

    Beautiful explanation, Sir! Could you please provide practice practice questions with solutions?

  • @anupammathur17
    @anupammathur17 Месяц назад

    Very helpful video with precise and at depth content. Kudos to you sir!!

  • @shubhamnayak9369
    @shubhamnayak9369 Месяц назад

    Why register 5 is not a part of scan chain?

  • @wenshengchen1918
    @wenshengchen1918 2 месяца назад

    I have a question: the faults discussed in this video seem like they don't appear at the same time, can ATPG and signature analyzer cover these multiple faults?

  • @youssefbahy7526
    @youssefbahy7526 2 месяца назад

    You are excellent

  • @youssefbahy7526
    @youssefbahy7526 2 месяца назад

    Great Explanaition

  • @vevekmanda6301
    @vevekmanda6301 2 месяца назад

    How can you take gamma as the same for jth and (j-1)th stage?

  • @vevekmanda6301
    @vevekmanda6301 2 месяца назад

    Fantastic explanation, an extremely underrated channel!

  • @adbanerjee9888
    @adbanerjee9888 2 месяца назад

    I have an intuitive understanding of why CLBs with inertial delays might block glitches with widths smaller than the inertial-delay width. The way I look at it is, if the inertial-delay time width is narrower than the glitch width, the sampling time will not even register the glitch as valid data. Is this a correct understanding? Also, is there a more quantitative explanation or resource to understand this further?

  • @rishithapulluru1082
    @rishithapulluru1082 2 месяца назад

    as always again a good video

  • @rishithapulluru1082
    @rishithapulluru1082 2 месяца назад

    hello sir i've a doubt.. can set up violation and hold violation be resolved after fabrication?

  • @rishithapulluru1082
    @rishithapulluru1082 3 месяца назад

    hello sir, first of all thank you for your huge efforts for making these videos and making it available for free for students seeking knowledge. I've a doubt about why storage node is at high impedence( at 8:45 ) if it is between curtoff transistors M5 and gate of M3, also previously also u mentioned in 4 transistor DRAM, while storing, Q node is high impedence node , dynamically high impedence node bcoz M1 is cutoff and M5 is cutoff , can you please elaborate on this?

  • @SumitKumar-tn5qz
    @SumitKumar-tn5qz 3 месяца назад

    G`H` ? If G or H is 1 then it will make additional product 0. but for GH = 01 10 00 the circuit should not have glitch

  • @mostafakassem9415
    @mostafakassem9415 3 месяца назад

    Best explanation of a process that I have ever encountered.👍

  • @gyulanagy5910
    @gyulanagy5910 5 месяцев назад

    ruclips.net/video/kxG83utFFDc/видео.html is AB.

  • @anirudhas1940
    @anirudhas1940 5 месяцев назад

    I believe the label is necessary for instantiating because I am literally unable to instantiate components without labels. It gives me errors.

  • @yazanallahham4813
    @yazanallahham4813 6 месяцев назад

    i dont usually comment but slutty explanation merci mon ami

  • @בןסגל-ו5צ
    @בןסגל-ו5צ 6 месяцев назад

    so in your example function, if I want to take care of both dynamic hazard and static hazard (0->1->0 and 1->0->1) I need to multiply the specific problematic term in F like you said to fix the dynamic hazard (let's denote it now as F_tilde) and in addition I need to multiply F_tilde with the term that fix the 0 static hazard and then add the term that fix the 1 static hazard? so all in all we will get that F_fixed = F_tilde * (0 static hazard fix term) + (1 static hazard fix term)?

  • @belovedsandworm
    @belovedsandworm 6 месяцев назад

    He just starts to introduce a Wallace Tree multiplier and immediately make two 'improvements.' It just adds confusion. Should stick to a simple example first, then note the improvements.

  • @inderjitsaini9303
    @inderjitsaini9303 7 месяцев назад

    Hello There, Thank you for the explanation Sir. I am having a bit of an issue while simulating the Read Mode of a 6T SRAM Cell. So, I can successfully write the value into the Cell and check if they are retained when I put the Cell in Standby Mode (WL = 0). However, For the Read Mode, what I do is I pass Pulse signal of VDD to both BL and BL' for about 1.5 microseconds and then keep it low. Then, I try to turn on the WL at 2 microseconds but what ends up happening is that both Q and Q' values are same which oscillate between 0.268 and 0.832 V. So, Should I actually Use Capacitors in the Circuit when using Read Mode so that the Capacitors can be pre-charged?

  • @XGR_Tisa
    @XGR_Tisa 7 месяцев назад

    Helpfull

  • @임재윤-e3j
    @임재윤-e3j 7 месяцев назад

    thank you so much for the video. now i can fully understand the method.

  • @sravanforu
    @sravanforu 7 месяцев назад

    One of the best lectures on metastability or probably the best explanation.

  • @josephhajj1570
    @josephhajj1570 7 месяцев назад

    How to become a layout engineer

  • @shubhamnayak9369
    @shubhamnayak9369 7 месяцев назад

    Very beautifully explained. Thanks for posting the videos professor.

  • @MoritzWallis
    @MoritzWallis 8 месяцев назад

    Incredible videos, thank you so much. So well structured and easy to understand!

  • @tuannghia967
    @tuannghia967 8 месяцев назад

    Thank you for your video. I always found it boring when I needed to read an explanation about the Wallace tree before. Therefore, I gave up before making an understanding of it.

  • @NostalgiaT
    @NostalgiaT 8 месяцев назад

    whats the use of encoder and decoder, why do we use it?

  • @NostalgiaT
    @NostalgiaT 8 месяцев назад

    whats the difference between asynchronous and sysnchrounos?

  • @uday7777777
    @uday7777777 9 месяцев назад

    Very useful series. Thank you so much. It is helpful for my career

  • @alexandermuller8858
    @alexandermuller8858 9 месяцев назад

    best and clearest explanation. I wish I knew that when I started with circuit design. It's so clear on point. Than you sir.

  • @yuezheng8128
    @yuezheng8128 10 месяцев назад

    For the predecoder, if there is AND gate available, could we replace NAND+Inverter to AND, what's the pros and cons?

    • @chabetto
      @chabetto 8 месяцев назад

      an AND is a NAND and an inverter - see the CMOS logic design

  • @birdinside28
    @birdinside28 10 месяцев назад

    Simple and precise!

  • @fo.centuries
    @fo.centuries 11 месяцев назад

    thankyou so much, great video

  • @can9977
    @can9977 Год назад

    Hi, is cc'+c' or c'(c+c') also represents dynamic hazard like cc'+c or c(c+c')?

  • @gvcallen
    @gvcallen Год назад

    Awesome video! Really thoroughly explained and I definitely learned a lot

  • @gvcallen
    @gvcallen Год назад

    Not sure how I discovered this channel but your introduction was pin-point for me (an EE graduate with no FPGA knowledge). Thanks!

  • @nashatali6030
    @nashatali6030 Год назад

    thanks for your effort Dr. Karim Abbas 👍

  • @Dg2020
    @Dg2020 Год назад

    thank you very much. helped a lot

  • @vivekartist6893
    @vivekartist6893 Год назад

    Your content is simple and fantastic! a lot of people are missing this out!

  • @frederikvanstolk5815
    @frederikvanstolk5815 Год назад

    Couple questions. * When computing the setup and CQ times, shouldn't we take into account the charging time of the capacitor? Or is this implicitly part of the tI's and tT's? * At 9:21 you mention that the requirements on the 1--1 and 0--0 overlap are more stringent than in static CMOS, and hence racing is more of an issue. But is it really that stringent? Roughly speaking, you'd think that the overlap time is roughly the delay time tI of a single inverter, right? * In the series of RC's in 10:54 onwards, why are they all connected? Wouldn't the transmission gates be closed alternatingly?

  • @frederikvanstolk5815
    @frederikvanstolk5815 Год назад

    Thank you for the wonderful lectures. I have a question about the cascaded network in 4:28 onwards. The PUN appear to receive an inverter clock signal. But would it not have been simpler to simply swap the tail nMOS and the head pMOS for a pMOS and nMOS respectively, and just give it an un-inverted clk?

  • @张扬-o4c
    @张扬-o4c Год назад

    great video!!!

  • @8754484388
    @8754484388 Год назад

    excellent tutorials , thank-you

  • @Rahulsharma-fo9fp
    @Rahulsharma-fo9fp Год назад

    Great explaination sir..This 7 minute video made me subscribe ur channel

  • @kprahladareddy
    @kprahladareddy Год назад

    Nice explanation | Helpful information ... Ty